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Structural phase transitions in ferroelectric crystals and thin films studied by VUV spectroscopic ellipsometry with synchrotron radiation

✍ Scribed by Dorywalski, Krzysztof; Andriyevsky, Bohdan; Piasecki, Michał; Kityk, Iwan; Cobet, Christoph; Esser, Norbert; Patryn, Aleksy


Book ID
118745287
Publisher
Taylor and Francis Group
Year
2013
Tongue
English
Weight
1010 KB
Volume
86
Category
Article
ISSN
0141-1594

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