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Real-time spectroscopic ellipsometry study of the growth of amorphous and microcrystalline silicon thin films prepared by alternating silicon deposition and hydrogen plasma treatment

✍ Scribed by Layadi, N.; Roca i Cabarrocas, P.; Drévillon, B.; Solomon, I.


Book ID
118280781
Publisher
The American Physical Society
Year
1995
Tongue
English
Weight
521 KB
Volume
52
Category
Article
ISSN
1098-0121

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