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Study by real time ellipsometry of the growth of amorphous and microcrystalline silicon thin films combining glow discharge decomposition and UV light irradiation

✍ Scribed by N. Layadi; P. Roca i Cabarrocas; V. Yakovlev; B. Drévillon


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
414 KB
Volume
233
Category
Article
ISSN
0040-6090

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