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Structural properties of relaxed Ge buffer layers on Si(0 0 1): effect of layer thickness and low temperature Si initial buffer

✍ Scribed by T. Myrberg; A. P. Jacob; O. Nur; M. Friesel; M. Willander; C. J. Patel; Y. Campidelli; C. Hernandez; O. Kermarrec; D. Bensahel

Book ID: 111591057
Publisher: Springer US
Year: 2004
Tongue: English
Weight: 487 KB
Volume: 15
Category: Article
ISSN: 0957-4522
DOI: 10.1023/b:jmse.0000031594.36498.27

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