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Structural degradation of thermal SiO2 on Si by high-temperature annealing: Defect generation

✍ Scribed by Stesmans, A.; Nouwen, B.; Afanas’ev, V.


Book ID
111872976
Publisher
The American Physical Society
Year
2002
Tongue
English
Weight
333 KB
Volume
66
Category
Article
ISSN
1098-0121

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