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Structural defects in SiO2/SiC interface probed by a slow positron beam

✍ Scribed by M. Maekawa; A. Kawasuso; Z.Q. Chen; M. Yoshikawa; R. Suzuki; T. Ohdaira

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Defect layer in SiO2–SiC interface prove

✍ M. Maekawa; A. Kawasuso; M. Yoshikawa; A. Miyashita; R. Suzuki; T. Ohdaira 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 194 KB

Interface defects introduced in Si/SiO2

✍ S. Alexandrova; A. Szekeres; I. Nedev 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 342 KB

Microvoids and defect chemistry at the S

📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 127 KB