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Defect layer in SiO2–SiC interface proved by a slow positron beam

✍ Scribed by M. Maekawa; A. Kawasuso; M. Yoshikawa; A. Miyashita; R. Suzuki; T. Ohdaira


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
194 KB
Volume
376-377
Category
Article
ISSN
0921-4526

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