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Structural comparative study by RBS and XPD of stoichiometric and Bi-deficient SrBi2Nb2O9 thin films epitaxially grown on (1 0 0)SrTiO3

✍ Scribed by J.-R. Duclère; M. Guilloux-Viry; F. Solal; C. Clerc; F. Lalu; A. Perrin; G. Jézéquel


Book ID
108278986
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
695 KB
Volume
569
Category
Article
ISSN
0039-6028

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