Effect of excess Bi2O3 on structures and dielectric properties of Bi1.5Zn1.0Nb1.5O7 thin films deposited at room temperature by RF magnetron sputtering

✍ Scribed by Saeed Khan, M.; Ren, Wei; Shi, Peng; Chen, Xiaofeng; Wu, Xiaoqing

• Book ID: 122482496
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 576 KB
• Volume: 39
• Category: Article
• ISSN: 0272-8842
• DOI: 10.1016/j.ceramint.2012.10.115