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Structural characterization of yttrium oxide thin films using transmission electron microscopy

✍ Scribed by B. W. Krakauer; J. S. Gau; D. J. Smith

Publisher
Springer
Year
1986
Tongue
English
Weight
966 KB
Volume
5
Category
Article
ISSN
0261-8028

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## Abstract The phase transformations in tungsten oxide (WO~3~) thin films have been investigated in the temperature range of 30–500 Β°C using transmission electron microscopy (TEM) and selected area electron diffraction (SAED) measurements. The results indicate that the phase transitions in WO~3~ t