Electron microscopy investigation of structural transformations in tungsten oxide (WO3) thin films

✍ Scribed by Ramana, C. V. ;Utsunomiya, S. ;Ewing, R. C. ;Julien, C. M. ;Becker, U.

• Publisher: John Wiley and Sons
• Year: 2005
• Tongue: English
• Weight: 133 KB
• Volume: 202
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.200521076

✦ Synopsis

Abstract

The phase transformations in tungsten oxide (WO~3~) thin films have been investigated in the temperature range of 30–500 °C using transmission electron microscopy (TEM) and selected area electron diffraction (SAED) measurements. The results indicate that the phase transitions in WO~3~ thin films occur in sequence exhibiting various crystal phases above room temperature in the order: monoclinic → orthorhombic → hexagonal. The crystallographic distortions and tilting of the WO~6~ octahedra are responsible for the phase transitions and significantly affect the electronic properties and, hence, the device applications of WO~3~. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)