Elemental depth profile examined using secondary-ion mass spectroscopy and structural profile examined using grazing-incident X-ray difiactometry were applied to analyze the growth behavior of Pb, -, La,(Zr,Ti, ~ ,)03 (PLZTO) and Pb, -La,TiO, (PLTO) thin films deposited on a Si substrate. When depos
Structural characterization of pulsed laser deposited poly(methylmethacrylate) thin films
β Scribed by B. Fazio; S. Trusso; E. Fazio; F. Neri
- Publisher
- John Wiley and Sons
- Year
- 2008
- Tongue
- English
- Weight
- 368 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0377-0486
- DOI
- 10.1002/jrs.1865
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