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Structural characterization of GaN epilayers on silicon: Effect of buffer layers

✍ Scribed by L. M. Sorokin; A. E. Kalmykov; V. N. Bessolov; N. A. Feoktistov; A. V. Osipov; S. A. Kukushkin; N. V. Veselov

Book ID: 111451005
Publisher: SP MAIK Nauka/Interperiodica
Year: 2011
Tongue: English
Weight: 689 KB
Volume: 37
Category: Article
ISSN: 1063-7850
DOI: 10.1134/s1063785011040158

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