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Structural and electrical properties of Au/Pt/Ti ohmic contacts to degenerated doped n-GaAs

✍ Scribed by J. Zhou; G. Xia; B. Li; W. Liu


Book ID
106018558
Publisher
Springer
Year
2003
Tongue
English
Weight
294 KB
Volume
76
Category
Article
ISSN
1432-0630

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Electrical and microstructural propertie
✍ Rajagopal Reddy, V. ;Choi, Chel-Jong πŸ“‚ Article πŸ“… 2007 πŸ› John Wiley and Sons 🌐 English βš– 473 KB

## Abstract The microstructural and electrical properties of Ti/Re/Au (10 nm/10 nm/50 nm) ohmic contacts to moderately doped n‐type GaN (4.0 Γ— 10^18^ cm^–3^) have been investigated by current–voltage (__I__ –__V__), Auger electron microscopy (AES) and transmission electron microscopy (TEM). The ele