## Abstract The effects of rapid thermal annealing on the electrical and structural properties of Pd/Au Schottky contacts to n‐type InP(111) have been investigated by current–voltage (__I__ –__V__), capacitance–voltage (__C__ –__V__) and X‐ray diffraction (XRD) measurements. The barrier height of t
The influence of rapid thermal annealing on electrical and structural properties of Pt/Au Schottky contacts to n-type InP
✍ Scribed by M. Bhaskar Reddy; V. Janardhanam; A. Ashok Kumar; V. Rajagopal Reddy; P. Narasimha Reddy; Chel-Jong Choi; Ranju Jung; Sung Hur
- Publisher
- Springer US
- Year
- 2009
- Tongue
- English
- Weight
- 854 KB
- Volume
- 21
- Category
- Article
- ISSN
- 0957-4522
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