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Structural and electrical characteristics of a high-k Lu2O3 charge trapping layer for nonvolatile memory application

โœ Scribed by Tung-Ming Pan; Fa-Hsyang Chen; Ji-Shing Jung


Book ID
113784642
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
472 KB
Volume
133
Category
Article
ISSN
0254-0584

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