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Comparison of the structural properties and electrical characteristics of Pr2O3, Nd2O3 and Er2O3 charge trapping layer memories

✍ Scribed by Pan, Tung-Ming; Yu, Te-Yi


Book ID
111933940
Publisher
Institute of Physics
Year
2009
Tongue
English
Weight
466 KB
Volume
24
Category
Article
ISSN
0268-1242

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✍ S. MusiΔ‡; S. PopoviΔ‡; M. RistiΔ‡; B. Sepiol πŸ“‚ Article πŸ“… 1994 πŸ› Springer 🌐 English βš– 406 KB

Chemical and structural properties of the system (1 -x)Fe203 -4-xNd203, 0 \_< x<\_ 1, were investigated using X-ray diffraction, 57Fe M6ssbauer spectroscopy and Fourier transform-infrared (FT-IR) spectroscopy. The samples were prepared by the chemical coprecipitation and thermal treatment of Fe(OH)3