𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Structural and electrical characterisation of ion-implanted strained silicon

✍ Scribed by K. Horan; A. Lankinen; L. O’Reilly; N.S. Bennett; P.J. McNally; B.J. Sealy; N.E.B. Cowern; T.O. Tuomi


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
556 KB
Volume
154-155
Category
Article
ISSN
0921-5107

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES