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Structural and chemical analysis of a model Si–SiO 2 interface using spatially resolved electron-energy-loss spectroscopy

✍ Scribed by Cheynet, M. C.; Epicier, T.

Book ID
120015609
Publisher
Taylor and Francis Group
Year
2004
Tongue
English
Weight
1002 KB
Volume
84
Category
Article
ISSN
1478-6435

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