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Analysis of chemical-vapour-deposited diamond grain boundaries using transmission electron microscopy and parallel electron energy loss spectroscopy in a scanning transmission electron microscope

✍ Scribed by Fallon, P.J.; Brown, L.M.

Book ID: 121774758
Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 952 KB
Volume: 2
Category: Article
ISSN: 0925-9635
DOI: 10.1016/0925-9635(93)90265-4

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