We have measured the capacitance of a silicon wafer contained between two bulk metallic electrodes. The capacitance has a prominent, feature which is frequency and magnetic field dependent at. a temperature of about 5K for a 0.2f~-cm nominal resistance sample, and which is seen to be replicated at h
โฆ LIBER โฆ
Strip dielectric wave guide antenna-for the measurement of dielectric constant of low-loss materials
โ Scribed by Rastogi, Alok Kumar ;Tiwari, A. K. ;Shrivastava, R. P.
- Publisher
- Springer
- Year
- 1993
- Tongue
- English
- Weight
- 329 KB
- Volume
- 14
- Category
- Article
- ISSN
- 0195-9271
No coin nor oath required. For personal study only.
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