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Measurement of low losses of dielectric materials in the decimeter waveband by the transformation method

✍ Scribed by N. M. Karikh; N. M. Zaslonova

Publisher
Springer US
Year
1978
Tongue
English
Weight
249 KB
Volume
21
Category
Article
ISSN
0543-1972

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πŸ“œ SIMILAR VOLUMES

On the measurement of the complex permit
On the measurement of the complex permittivity of layers embedded in a multilayered dielectric material with the use of a free-space method
✍ Israel Garcia-Ruiz; Carlos D. Aviles-Castro; Hildeberto JardΓ³n-Aguilar; Juan Gue πŸ“‚ Article πŸ“… 2002 πŸ› John Wiley and Sons 🌐 English βš– 218 KB

## Abstract Free‐space method approaches for obtaining the complex permittivity of dielectric layers embedded in a multilayer dielectric material are investigated. Solids, liquids, and granular materials have been tested; a description of the de‐embedding process is presented in detail, as are the