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On the measurement of the complex permittivity of layers embedded in a multilayered dielectric material with the use of a free-space method

✍ Scribed by Israel Garcia-Ruiz; Carlos D. Aviles-Castro; Hildeberto Jardón-Aguilar; Juan Guerra-Vargas

Publisher
John Wiley and Sons
Year
2002
Tongue
English
Weight
218 KB
Volume
33
Category
Article
ISSN
0895-2477

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✦ Synopsis

Abstract

Free‐space method approaches for obtaining the complex permittivity of dielectric layers embedded in a multilayer dielectric material are investigated. Solids, liquids, and granular materials have been tested; a description of the de‐embedding process is presented in detail, as are the measured permittivity values. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 33: 422–426, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10340

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