## Abstract Free‐space method approaches for obtaining the complex permittivity of dielectric layers embedded in a multilayer dielectric material are investigated. Solids, liquids, and granular materials have been tested; a description of the de‐embedding process is presented in detail, as are the
Evaluation of the complex permittivity of layered dielectric materials with the use of an open-ended coaxial line
✍ Scribed by Devendra K. Misra
- Publisher
- John Wiley and Sons
- Year
- 1996
- Tongue
- English
- Weight
- 551 KB
- Volume
- 11
- Category
- Article
- ISSN
- 0895-2477
No coin nor oath required. For personal study only.
✦ Synopsis
Dielectric constant
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