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Strain field and related roughness formation in SiGe relaxed buffer layers

✍ Scribed by K. Sawano; N. Usami; K. Arimoto; K. Nakagawa; Y. Shiraki


Book ID
108289134
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
409 KB
Volume
508
Category
Article
ISSN
0040-6090

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