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Strain and band-edge alignment in single and multiple layers of self-assembled Ge/Si and GeSi/Si islands

✍ Scribed by Schmidt, O. G.; Eberl, K.; Rau, Y.


Book ID
120734369
Publisher
The American Physical Society
Year
2000
Tongue
English
Weight
268 KB
Volume
62
Category
Article
ISSN
1098-0121

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The in situ transmission electron microscope allows us to visualise processes occurring at surfaces and interfaces in real time and is therefore capable of providing detailed, quantitative information about reaction mechanisms. We have used a UHV TEM equipped with in situ growth capabilities to stud