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Raman characterization of strain and composition in small-sized self-assembled Si/Ge dots

✍ Scribed by Tan, P. H.; Brunner, K.; Bougeard, D.; Abstreiter, G.

Book ID
118005993
Publisher
The American Physical Society
Year
2003
Tongue
English
Weight
180 KB
Volume
68
Category
Article
ISSN
1098-0121

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