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Statistical analysis of subthreshold leakage current for VLSI circuits

✍ Scribed by Rao, R.; Srivastava, A.; Blaauw, D.; Sylvester, D.

Book ID: 111869503
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 310 KB
Volume: 12
Category: Article
ISSN: 1063-8210
DOI: 10.1109/tvlsi.2003.821549

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