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Static secondary ion mass spectrometry (S-SIMS) Part 1: methodology and structural interpretation

โœ Scribed by Luc Van Vaeck; Annemie Adriaens; Renaat Gijbels

Publisher
John Wiley and Sons
Year
1999
Tongue
English
Weight
582 KB
Volume
18
Category
Article
ISSN
0277-7037

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๐Ÿ“œ SIMILAR VOLUMES

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## Abstract Most of the firstโ€row transitionโ€metal oxides, M~A~O~B~ (M = Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn) were examined by static secondary ion mass spectrometry (sโ€SIMS) and laser ablation/ionization Fourier transform ion cyclotron resonance mass spectrometry (LAโ€FTICRMS). Positive and negat