๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Characterisation of electrospun nanowebs with static secondary ion mass spectrometry (S-SIMS)

โœ Scribed by P. Van Royen; A.M. dos Santos; E. Schacht; L. Ruys; L. Van Vaeck

Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
278 KB
Volume
252
Category
Article
ISSN
0169-4332

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Static secondary ion mass spectrometry (
Static secondary ion mass spectrometry (S-SIMS) Part 2: material science applications
โœ Annemie Adriaens; Luc Van Vaeck; Freddy Adams ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 533 KB

The acquisition of images in which the brightness of each pixel reยฏects the abundance of speciยฎc mass selected ions and thereby the local surface concentration, is a rather unique feature in molecular MS. It allows direct visualization of phases with distinct chemical composition in, e.g., polymer b

Speciation analysis of oxides with stati
Speciation analysis of oxides with static secondary ion mass spectrometry
โœ Erik Cuynen; Luc Van Vaeck; Pierre Van Espen ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 227 KB ๐Ÿ‘ 2 views

Speciation analysis of inorganic solids, without dissolution of the sample, aims at specific molecular information. Two potentially useful microanalytical techniques emerge, namely, laser microprobe mass spectrometry (LMMS) and static secondary ion mass spectrometry (S-SIMS). This paper focuses on t