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Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films

✍ Scribed by Bart Boschmans; Myriam Vanneste; Luc Ruys; Eef Temmerman; Christophe Leys; Luc Van Vaeck

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 282 KB
Volume: 252
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2006.02.240

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## Abstract Time of flight secondary ion mass spectrometry (ToF‐SIMS) is an ideal technique for the analysis of adsorbed protein films because of its surface sensitivity and chemical specificity. In this study, we examined ToF‐SIMS with the multivariate calibration method partial least squares regr