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Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS)

✍ Scribed by R. De Mondt; L. Adriaensen; F. Vangaever; J. Lenaerts; L. Van Vaeck; R. Gijbels


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
216 KB
Volume
252
Category
Article
ISSN
0169-4332

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