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Stacking fault probability in β-SiC grown by chemical vapour deposition

✍ Scribed by Yang-Ming Lu; Min-Hsiung Hon

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 812 KB
Volume: 8
Category: Article
ISSN: 0921-5107
DOI: 10.1016/0921-5107(91)90043-u

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