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Sputter depth profiling of InN layers

✍ Scribed by R Kosiba; G Ecke; V Cimalla; L Spieß; S Krischok; J.A Schaefer; O Ambacher; W.J Schaff


Book ID
113822581
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
739 KB
Volume
215
Category
Article
ISSN
0168-583X

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Sputter depth profile analysis of marker
✍ J. A. Peinador; I. Abril; J. J. Jiménez-Rodríguez; A. Gras-Marti 📂 Article 📅 1990 🏛 John Wiley and Sons 🌐 English ⚖ 314 KB

## Abstract We study theoretically the distortion of marker layers embedded in homogeneous media due to energetic ion bombardment. For realistic relocation cross‐sections, we have solved the balance equation, first proposed by Sigmund and co‐workers, for the evolution of irradiated polyatomic targe