✦ LIBER ✦

Sputter deposition of multilayered structures for use in sputter depth profile calibration

✍ Scribed by B. Navinšek; J. Fine

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Influence of the individual layer thickn

✍ D. Marton 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 243 KB

AES sputter depth profiling of Cr/Ni mul

✍ A Zalar; EW Seibt; P Panjan 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 511 KB

Depth resolution and surface roughness e

✍ S. Hofmann; J. Erlewein; A. Zalar 📂 Article 📅 1977 🏛 Elsevier Science 🌐 English ⚖ 479 KB

Influence of base pressure on structure

✍ Fukio Yoshizaki; Toshiki Kingetsu 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 1000 KB

On the evaluation of depth resolution fr

✍ D. Marton; J. László 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 135 KB

Reply to “on the evaluation of depth res

✍ S. Hofmann 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 152 KB