✦ LIBER ✦
Depth resolution and surface roughness effects in sputter profiling of NiCr multilayer sandwich samples using Auger electron spectroscopy
✍ Scribed by S. Hofmann; J. Erlewein; A. Zalar
- Publisher
- Elsevier Science
- Year
- 1977
- Tongue
- English
- Weight
- 479 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0040-6090
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