✦ LIBER ✦

AES sputter depth profiling of Cr/Ni multilayers using Ar+, O2+ and N2+ ions

✍ Scribed by A Zalar; EW Seibt; P Panjan

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

AES sputter depth profiling of Cr/Ni mul

📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 132 KB

Oxide thin films formed during rotationa

✍ A. Zalar; E.W. Seibt; P. Panjan 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 425 KB

Auger electron spectroscopy depth profil

✍ S. Hofmann; A. Zalar 📂 Article 📅 1979 🏛 Elsevier Science 🌐 English ⚖ 603 KB

Auger electron spectroscopy composition

✍ J. Liday; R. Harman; G. Badin; J. Breza; A. Zalar 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 485 KB

Characterization of ion-beam- and magnet

✍ C. Mössner; K.-D. Ufert; P. Köpfer; V. Rupertus; H. Oechsner 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 410 KB