AES sputter depth profiling of Cr/Ni multilayers using Ar+, O2+ and N2+ ions : A. Zalar, E. W. Seibt and P. Panjan. Vacuum40(1/2), 71 (1990)

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 132 KB
• Volume: 30
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(90)90374-v