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Oxide thin films formed during rotational AES sputter depth profiling ofNi/Cr multilayers using oxygen ions

✍ Scribed by A. Zalar; E.W. Seibt; P. Panjan


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
425 KB
Volume
100-101
Category
Article
ISSN
0169-4332

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