SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 18 April 2011)] EUV and X-Ray Optics: Synergy between Laboratory and Space II - Problem of roughness detection for supersmooth surfaces

✍ Scribed by Barysheva, M. M.; Gribkov, B. A.; Vainer, Yu. A.; Zorina, M. V.; Pestov, A. E.; Platonov, Y. Y.; Rogachev, D. N.; Salashchenko, N. N.; Chkhalo, N. I.; Hudec, René; Pina, Ladislav

• Book ID: 120424410
• Publisher: SPIE
• Year: 2011
• Weight: 430 KB
• Volume: 8076
• Category: Article
• DOI: 10.1117/12.886470