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SPIE Proceedings [SPIE SPIE Europe Optics + Optoelectronics - Prague, Czech Republic (Monday 20 April 2009)] EUV and X-Ray Optics: Synergy between Laboratory and Space - Formation of silicides in annealed periodic multilayers

✍ Scribed by Maury, H.; Jonnard, P.; Le Guen, K.; André, J.-M.; Hudec, René; Pina, Ladislav


Book ID
121423210
Publisher
SPIE
Year
2009
Weight
622 KB
Volume
7360
Category
Article

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