SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Visual and dynamic measurement of temperature fields by use of digital holographic interferometry

✍ Scribed by Zhao, Jianlin; Lehmann, Peter H.; Osten, Wolfgang; Di, Jianglei; Wu, Bingjing; Albertazzi, Armando; Wang, Jun; Wang, Qian; Jiang, Hongzhen

• Book ID: 120611383
• Publisher: SPIE
• Year: 2013
• Weight: 911 KB
• Volume: 8788
• Category: Article
• DOI: 10.1117/12.2020369