SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - A computational tool to highlight anomalies on shearographic images in optical flaw detection

✍ Scribed by Fantin, A. V.; Lehmann, Peter H.; Osten, Wolfgang; Willemann, D. P.; Viotti, M.; Albertazzi, Armando; Albertazzi, A.

• Book ID: 120474332
• Publisher: SPIE
• Year: 2013
• Weight: 916 KB
• Volume: 8788
• Category: Article
• DOI: 10.1117/12.2020978