𝔖 Bobbio Scriptorium

✦ LIBER ✦

SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - Influence of surface structure on shape and roughness measurement using two-wavelength speckle interferometry

✍ Scribed by Bodendorfer, Thomas; Mayinger, Philipp; Koch, Alexander W.; Bodermann, Bernd; Frenner, Karsten; Silver, Richard M.

Book ID: 120395485
Publisher: SPIE
Year: 2013
Weight: 566 KB
Volume: 8789
Category: Article
DOI: 10.1117/12.2020270

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

SPIE Proceedings [SPIE SPIE Optical Metr

SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - Investigation of microstructured fiber geometries by scatterometry

✍ Hansen, Poul-Erik; Burger, Sven; Bodermann, Bernd; Frenner, Karsten; Silver, Ric 📂 Article 📅 2013 🏛 SPIE ⚖ 683 KB

SPIE Proceedings [SPIE SPIE Optical Metr

SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - Modeling of Risley prisms devices for exact scan patterns

✍ Schitea, Alexandru; Tuef, Marius; Duma, Virgil-Florin; Vlaicu, Aurel M.; Boderma 📂 Article 📅 2013 🏛 SPIE ⚖ 816 KB

SPIE Proceedings [SPIE SPIE Optical Metr

SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - Multi resonant platform based on modified metallic nanoparticles for biological tissue characterization

✍ Iovine, Renato; La Spada, L.; Tarparelli, R.; Vegni, L.; Bodermann, Bernd; Frenn 📂 Article 📅 2013 🏛 SPIE ⚖ 453 KB

SPIE Proceedings [SPIE SPIE Optical Metr

SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - Characterisation and comparison of ophthalmic instrument quality using a model eye with reverse ray-tracing

✍ Sheil, Conor; Goncharov, Alexander V.; Bodermann, Bernd; Frenner, Karsten; Silve 📂 Article 📅 2013 🏛 SPIE ⚖ 778 KB

SPIE Proceedings [SPIE SPIE Optical Metr

SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - Efficient and stable numerical method for evaluation of Zernike polynomials and their Cartesian derivatives

✍ Novák, Pavel; Novák, Jíří; Bodermann, Bernd; Frenner, Karsten; Silver, Richard M 📂 Article 📅 2013 🏛 SPIE ⚖ 418 KB

SPIE Proceedings [SPIE SPIE Optical Metr

SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optics for Arts, Architecture, and Archaeology IV - Surface skeleton generation based on 360-degree profile scan

✍ Chen, Lujie; Pezzati, Luca; Targowski, Piotr; Sass, Lawrence; Sung, Woong Ki; No 📂 Article 📅 2013 🏛 SPIE ⚖ 758 KB