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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Optical Manufacturing and Testing X - Algorithms for surface reconstruction from curvature data for freeform aspherics

✍ Scribed by Kim, Dae Wook; Kim, ByoungChang; Zhao, Chunyu; Oh, ChangJin; Burge, James H.; Fähnle, Oliver W.; Williamson, Ray; Kim, Dae Wook

Book ID: 121488504
Publisher: SPIE
Year: 2013
Weight: 618 KB
Volume: 8838
Category: Article
DOI: 10.1117/12.2024285

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