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SPIE Proceedings [SPIE Seventh International Conference on Thin Film Physics and Applications - Shanghai, China (Friday 24 September 2010)] Seventh International Conference on Thin Film Physics and Applications - Growth orientation and surface morphology of CeO2 films for high-Jc YBCO films on biaxially textured Ni tape by PLD

✍ Scribed by Liu, Huaran; Liu, Linfei; Song, Xiaokun; Hong, Dan; Wang, Ying; Li, Yijie; Chu, Junhao; Wang, Zhanshan

Book ID: 121343355
Publisher: SPIE
Year: 2010
Weight: 895 KB
Volume: 7995
Category: Article
DOI: 10.1117/12.888280

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