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SPIE Proceedings [SPIE Seventh International Conference on Thin Film Physics and Applications - Shanghai, China (Friday 24 September 2010)] Seventh International Conference on Thin Film Physics and Applications - Comparison of envelope method and full spectra fitting method for determination of optical constants of thin films

✍ Scribed by Liu, Huasong; Hou, Dehai; Wang, Zhanshan; Ji, Yiqin; Fan, Yongkai; Fan, Rongwei; Chu, Junhao; Wang, Zhanshan

Book ID: 120329830
Publisher: SPIE
Year: 2010
Weight: 345 KB
Volume: 7995
Category: Article
DOI: 10.1117/12.888438

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