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SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Metrology in Production Engineering - Optical characterization of liquid-crystal-on-silicon displays

✍ Scribed by Proll, Klaus-Peter; Kohler, Christian; Baumbach, Torsten; Osten, Wolfgang; Osten, Stefan; Gruber, Hartmut; Langner, Andreas; Wernicke, Gunther; Osten, Wolfgang; Takeda, Mitsuo

Book ID: 121722287
Publisher: SPIE
Year: 2004
Weight: 268 KB
Volume: 5457
Category: Article
DOI: 10.1117/12.554769

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