SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Metrology in Production Engineering - High-resolution shape measurements with phase-shifting Schlieren (PSS)

✍ Scribed by Joannes, Luc C.; Beghuin, Didier; Ligot, Renaud; Farinotti, Sebastien; Dupont, Olivier; Osten, Wolfgang; Takeda, Mitsuo

• Book ID: 120995013
• Publisher: SPIE
• Year: 2004
• Weight: 397 KB
• Volume: 5457
• Category: Article
• DOI: 10.1117/12.545536