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SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Metrology in Production Engineering - Color prediction in textile application

✍ Scribed by De Lucia, Maurizio; Buonopane, Massimo; Osten, Wolfgang; Takeda, Mitsuo

No coin nor oath required. For personal study only.

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